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Academy of Mathematics and Systems Science, CAS Colloquia & Seminars：Introduction of Semiconductor Measuring Equipment Technology
半导体测量 设备技术 半导体
2023/4/21
本报告结合个人在半导体量测设备技术行业的工作经历，简要介绍半导体领域的技术，主要包括芯片制造工艺流程，光学量测技术OCD，器件几何建模，光学仿真算法RCWA和明暗场检测设备图像处理集群。
Probabilistic teleportation via rotation operating and computation basis measuring
teleportation entangled state rotational operation computation basis measurement
2010/7/16
A scheme for teleporting an unknown quantum state via a partially entangled particle pair is
proposed. We show that teleportation can be successful realized with unit fidelity but less than unit prob...
The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic Components
the Non-Contacting Temperature Measuring Techniques Hidden Faults Electronic Components
2010/12/23
One of the reasons for a reduction of production quality is the so-called ‘hidden faults’, i.e. defects which will not be detected by the available testing equipment in spite of measures for ensuring ...
Inaccuracies of Measuring Methods and Their Influence on the Regression Function
the Regression Function electronic components the materials
2010/12/23
The quality parameters of electronic components and devices usually depend on the parameters of the materials. In many cases one does not know the theoretical relationship between the parameters, and ...