搜索结果: 1-5 共查到“物理学 Atomic Force Microscopy”相关记录5条 . 查询时间(0.069 秒)
State Feedback Control for Adjusting the Dynamic Behavior of a Piezoactuated Bimorph Atomic Force Microscopy Probe
State Feedback Control Dynamic Behavior Piezoactuated Bimorph Atomic Microscopy Probe Atomic Physics
2012/4/24
We adjust the transient dynamics of a piezo-actuated bimorph Atomic Force Microscopy (AFM) probe using a state feedback controller. This approach enables us to adjust the quality factor and the resona...
The Role of Nonlinear Dynamics in Quantitative Atomic Force Microscopy
Role Nonlinear Dynamics Quantitative Atomic Force Microscopy
2012/2/27
Various methods of force measurement with the Atomic Force Microscope (AFM) are compared for their ability to accurately determine the tip-surface force from analysis of the nonlinear cantilever motio...
Topographic and electronic contrast of the graphene moiré on Ir(111) probed by scanning tunneling microscopy and non-contact atomic force microscopy
Topographi electronic contrast tunneling microscopy non-contact atomic force microscopy
2010/11/23
Epitaxial graphene grown on single crystal transition metal surfaces typically exhibits a moiré
pattern due to the lattice mismatch between graphene and the underlying metal surface. We use si-multan...
Potential contributions of noncontact atomic force microscopy for the future Casimir force measurements
Potential contributions noncontact atomic force microscopy the future Casimir force measurements
2010/11/5
Surface electric noise, i.e., the non-uniform distribution of charges and potentials on a surface, poses a great experimental challenge in modern precision force measurements. Such a challenge is enc...
期刊信息
篇名
Inter-Spherulite Voundary Strucrure in Bulk-crystallized Polethylenes Directly Observed by Atomic Force Microscopy
语种
英文
撰写或编译
作者
滕洪祥,史燚,金熹高
第一作者单位
刊物名称
Polymer Journal
页面
2003, 35, 436
出版日期
2...